Researchers have created the world's first graph-based mung bean pan-genome, revealing genetic variations linked to yield, nutrition, and pest resistance, and providing breeders with powerful tools to accelerate crop improvement and strengthen food security. The post Mung Bean Pan-Genome Study Maps Key Genes for Yield, Nutrition, and Pest Resistance appeared first on GEN – Genetic Engineering and Biotechnology News.
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David Miller
a pharmacist, a tech enthusiastic, who explored the Internet to gather all latest information pharma, biotech, healthcare and other related industries.